Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6, - John V. Gilfrich (Sachs / Freeman Associates / NRL, Washington, DC, USA) - Books - Kluwer Academic Publishers Group - 9780306449017 - September 30, 1994
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Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6, 1st edition

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Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 30, 1994
ISBN13 9780306449017
Publishers Kluwer Academic Publishers Group
Pages 778
Dimensions 264 × 184 × 47 mm   ·   1.59 kg
Language English  
Editor C.C. Goldsmith
Editor I. Cev Noyan (IBM Research Center, Yorktown Heights, NY, USA)
Editor Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania, USA)
Editor Ting C. Huang (IBM Almaden Research Center, San Jose, CA, USA)

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