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Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6, John V. Gilfrich (Sachs / Freeman Associates / NRL, Washington, DC, USA) 1st edition
Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,
John V. Gilfrich (Sachs / Freeman Associates / NRL, Washington, DC, USA)
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | September 30, 1994 |
| ISBN13 | 9780306449017 |
| Publishers | Kluwer Academic Publishers Group |
| Pages | 778 |
| Dimensions | 264 × 184 × 47 mm · 1.59 kg |
| Language | English |
| Editor | C.C. Goldsmith |
| Editor | I. Cev Noyan (IBM Research Center, Yorktown Heights, NY, USA) |
| Editor | Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania, USA) |
| Editor | Ting C. Huang (IBM Almaden Research Center, San Jose, CA, USA) |