Fundamentals of Nanoscale Film Analysis - Terry L. Alford - Books - Springer-Verlag New York Inc. - 9780387292601 - February 16, 2007
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Fundamentals of Nanoscale Film Analysis 2007 edition

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From materials science to integrated circuit development, technology is moving from the microscale toward the nanoscale. This book reviews the fundamental physics underlying techniques for analyzing the surfaces and near-surfaces.


350 pages, 200 black & white illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 16, 2007
ISBN13 9780387292601
Publishers Springer-Verlag New York Inc.
Pages 350
Dimensions 166 × 243 × 27 mm   ·   703 g
Language English  

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