Scanning Microscopy for Nanotechnology: Techniques and Applications - Weilie Zhou - Books - Springer-Verlag New York Inc. - 9780387333250 - November 27, 2006
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Scanning Microscopy for Nanotechnology: Techniques and Applications 2007 edition

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.


552 pages, 399 black & white illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 27, 2006
ISBN13 9780387333250
Publishers Springer-Verlag New York Inc.
Pages 522
Dimensions 155 × 235 × 30 mm   ·   1.05 kg
Language English  
Editor Wang, Zhong Lin
Editor Zhou, Weilie

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