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Scanning Microscopy for Nanotechnology: Techniques and Applications Weilie Zhou 2007 edition
Scanning Microscopy for Nanotechnology: Techniques and Applications
Weilie Zhou
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.
552 pages, 399 black & white illustrations, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | November 27, 2006 |
| ISBN13 | 9780387333250 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 522 |
| Dimensions | 155 × 235 × 30 mm · 1.05 kg |
| Language | English |
| Editor | Wang, Zhong Lin |
| Editor | Zhou, Weilie |
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