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Digital Integrated Circuit Testing from a Quality Perspective Eugene R. Hnatek 1993 edition
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Digital Integrated Circuit Testing from a Quality Perspective
Eugene R. Hnatek
Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
180 pages, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | August 31, 1993 |
| ISBN13 | 9780442006433 |
| Publishers | Kluwer Academic Publishers Group |
| Pages | 180 |
| Dimensions | 156 × 234 × 12 mm · 476 g |
| Language | English |
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