Accelerated Testing: Statistical Models, Test Plans, and Data Analysis - Wiley Series in Probability and Statistics - Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois) - Books - John Wiley & Sons Inc - 9780471697367 - December 1, 2007
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Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois)
Accelerated Testing: Statistical Models, Test Plans, and Data Analysis - Wiley Series in Probability and Statistics 2 Revised edition

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Useful methodology has been developed in accelerated testing. This work deals with the topic Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. It is useful for practitioners.

624 pages, black & white illustrations, figures

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 1, 2007
Original release date 2004
ISBN13 9780471697367
Publishers John Wiley & Sons Inc
Pages 624
Dimensions 154 × 232 × 38 mm   ·   820 g
Language English  

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