Reliability Wearout Mechanisms in Advanced CMOS Technologies - IEEE Press Series on Microelectronic Systems - Strong, Alvin W. (IBM) - Books - John Wiley & Sons Inc - 9780471731726 - September 4, 2009
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Strong, Alvin W. (IBM)
Reliability Wearout Mechanisms in Advanced CMOS Technologies - IEEE Press Series on Microelectronic Systems

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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

624 pages, Illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 4, 2009
ISBN13 9780471731726
Publishers John Wiley & Sons Inc
Pages 640
Dimensions 164 × 243 × 34 mm   ·   993 g
Language English  

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