Semiconductor Material and Device Characterization - IEEE Press - Schroder, Dieter K. (Arizona State University) - Books - John Wiley & Sons Inc - 9780471739067 - February 17, 2006
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Schroder, Dieter K. (Arizona State University)
Semiconductor Material and Device Characterization - IEEE Press 3rd edition

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This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.

800 pages, illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 17, 2006
ISBN13 9780471739067
Publishers John Wiley & Sons Inc
Pages 800
Dimensions 243 × 164 × 51 mm   ·   1.32 kg
Language English  

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