Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution - Tsong, Tien T. (Pennsylvania State University) - Books - Cambridge University Press - 9780521019934 - September 15, 2005
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Tsong, Tien T. (Pennsylvania State University)
Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

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Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.

400 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 15, 2005
ISBN13 9780521019934
Publishers Cambridge University Press
Pages 400
Dimensions 157 × 234 × 22 mm   ·   556 g
Language English  

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