Photo-induced Defects in Semiconductors - Cambridge Studies in Semiconductor Physics and Microelectronic Engineering - Redfield, David (Stanford University, California) - Books - Cambridge University Press - 9780521024457 - March 9, 2006
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Redfield, David (Stanford University, California)
Photo-induced Defects in Semiconductors - Cambridge Studies in Semiconductor Physics and Microelectronic Engineering

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This is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. These metastable defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices.

232 pages, 106 b/w illus.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released March 9, 2006
ISBN13 9780521024457
Publishers Cambridge University Press
Pages 232
Dimensions 152 × 229 × 14 mm   ·   350 g
Language English  
Series Editor Ahmad, Haroon
Series Editor Broers, Alec
Series Editor Pepper, Michael

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