Characterization of High Tc Materials and Devices by Electron Microscopy - Nigel D Browning - Books - Cambridge University Press - 9780521031707 - November 23, 2006
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Nigel D Browning
Characterization of High Tc Materials and Devices by Electron Microscopy

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This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.

408 pages, 267 b/w illus. 3 tables

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 23, 2006
ISBN13 9780521031707
Publishers Cambridge University Press
Pages 408
Dimensions 168 × 243 × 21 mm   ·   669 g
Language English  
Editor Browning, Nigel D. (University of Illinois, Chicago)
Editor Pennycook, Stephen J. (Oak Ridge National Laboratory, Tennessee)

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