Reflection High-Energy Electron Diffraction - Ichimiya, Ayahiko (Nagoya University, Japan) - Books - Cambridge University Press - 9780521453738 - December 13, 2004
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Ichimiya, Ayahiko (Nagoya University, Japan)
Reflection High-Energy Electron Diffraction

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Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts.

366 pages, 217 b/w illus. 5 tables

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 13, 2004
ISBN13 9780521453738
Publishers Cambridge University Press
Pages 366
Dimensions 170 × 244 × 21 mm   ·   884 g
Language English  

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