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Electronic Thin-Film Reliability Tu, King-Ning (University of California, Los Angeles)
Electronic Thin-Film Reliability
Tu, King-Ning (University of California, Los Angeles)
Based on a graduate course at UCLA, this book describes reliability and failure of thin films. Beginning with core topics such as deposition and diffusion, the book fully explains irreversible processes with practical examples. Closing with failure analysis, this book is ideal for graduate students, researchers and practitioners.
412 pages, 186 b/w illus. 23 tables
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | November 25, 2010 |
| ISBN13 | 9780521516136 |
| Publishers | Cambridge University Press |
| Pages | 412 |
| Dimensions | 180 × 254 × 23 mm · 957 g |
| Language | English |