Focused Ion Beam Systems: Basics and Applications - Nan Yao - Books - Cambridge University Press - 9780521831994 - September 13, 2007
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Nan Yao
Focused Ion Beam Systems: Basics and Applications

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This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

408 pages, 196 b/w illus.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 13, 2007
ISBN13 9780521831994
Publishers Cambridge University Press
Pages 408
Dimensions 252 × 180 × 29 mm   ·   952 g
Language English  
Editor Yao, Nan (Princeton University, New Jersey)

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