Noise in Bipolar Junction Transistors at Cryogenic Temperatures. - Thomas Wade - Books - Dissertation Discovery Company - 9780530019499 - December 8, 2019
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Thomas Wade
Noise in Bipolar Junction Transistors at Cryogenic Temperatures.

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Released December 8, 2019
ISBN13 9780530019499
Publishers Dissertation Discovery Company
Pages 258
Dimensions 150 × 220 × 20 mm   ·   889 g
Language English  

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