Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II - L Skuja - Books - Springer - 9780792366850 - December 31, 2000
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L Skuja
Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II 2000 edition

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Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000

624 pages, 87 black & white illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 31, 2000
ISBN13 9780792366850
Publishers Springer
Pages 624
Dimensions 155 × 235 × 34 mm   ·   1.06 kg
Language English  
Editor Griscom, David L.
Editor Pacchioni, Gianfranco
Editor Skuja, Linards

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