Analog Layout Generation Performance and Manufacturability - the Springer International Series in Engineering and Computer Science - Koen Lampaert - Books - Kluwer Academic Publishers - 9780792384793 - April 30, 1999
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Koen Lampaert
Analog Layout Generation Performance and Manufacturability - the Springer International Series in Engineering and Computer Science 1999 edition

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Outlines a criterion to quantify the detectability of a fault and combines this with a yield model to evaluate the testability of an integrated circuit layout. This book is intended for analog engineers, researchers and students.

190 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 30, 1999
ISBN13 9780792384793
Publishers Kluwer Academic Publishers
Pages 190
Dimensions 155 × 235 × 12 mm   ·   453 g
Language English  

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