Assessing Fault Model and Test Quality - The Springer International Series in Engineering and Computer Science - Kenneth M. Butler - Books - Springer - 9780792392224 - October 31, 1991
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Kenneth M. Butler
Assessing Fault Model and Test Quality - The Springer International Series in Engineering and Computer Science 1992 edition

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For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model.

132 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 31, 1991
ISBN13 9780792392224
Publishers Springer
Pages 132
Dimensions 155 × 235 × 11 mm   ·   399 g
Language English  

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