Modeling of Electrical Overstress in Integrated Circuits - the Springer International Series in Engineering and Computer Science - Carlos H. Diaz - Books - Kluwer Academic Publishers - 9780792395058 - November 30, 1994
In case cover and title do not match, the title is correct

Carlos H. Diaz
Modeling of Electrical Overstress in Integrated Circuits - the Springer International Series in Engineering and Computer Science 1994 edition

Price
$ 157.99
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jun 30 - Jul 6

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

Electrical overstress (EOS) and Electrostatic discharge (ESD) pose as one of the threats to integrated circuits (ICs). This book analyzes the EOS/ESD-related failures in I/O protection devices in integrated circuits. This book is intended for VLSI designers, reliability engineers and those working on the development of EOS/ESD analysis tools.

148 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 30, 1994
ISBN13 9780792395058
Publishers Kluwer Academic Publishers
Pages 148
Dimensions 156 × 234 × 11 mm   ·   394 g
Language English  

Mere med samme udgiver

See all of Carlos H. Diaz ( e.g. Hardcover Book and Paperback Book )