Microelectronic Manufacturing Yield Reliability and Failure Analysis-25-26 October 1995 Austin Texas - Piccoli - Books - SPIE Press - 9780819420015 - December 31, 1995
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Piccoli
Microelectronic Manufacturing Yield Reliability and Failure Analysis-25-26 October 1995 Austin Texas

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284 pages, illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 31, 1995
ISBN13 9780819420015
Publishers SPIE Press
Pages 284
Dimensions 150 × 220 × 10 mm   ·   629 g   (Weight (estimated))

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