Microelectronic Reliability Vol. I: Test - Edward B. Hakim - Books - Artech House Publishers - 9780890062845 - January 31, 1989
In case cover and title do not match, the title is correct

Edward B. Hakim
Microelectronic Reliability Vol. I: Test

Price
$ 159.99
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping May 26 - Jun 4

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

396 pages, 1, black & white illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 31, 1989
ISBN13 9780890062845
Publishers Artech House Publishers
Pages 396
Dimensions 161 × 238 × 30 mm   ·   771 g
Editor Hakim, Edward B.

See all of Edward B. Hakim ( e.g. Hardcover Book )