Microelectronic Reliability: Integrity a - Emiliano Pollino - Books - Artech House Publishers - 9780890063507 - April 1, 1989
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Emiliano Pollino
Microelectronic Reliability: Integrity a

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A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

556 pages, 1, black & white illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 1, 1989
ISBN13 9780890063507
Publishers Artech House Publishers
Pages 556
Dimensions 161 × 235 × 41 mm   ·   1.09 kg
Editor Pollino, Emiliano

See all of Emiliano Pollino ( e.g. Hardcover Book )