Reliability and Degradation of Iii-v Opt - Osamu Ueda - Books - Artech House Publishers - 9780890066522 - September 30, 1996
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Osamu Ueda
Reliability and Degradation of Iii-v Opt

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Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems.

372 pages, 1, black & white illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 30, 1996
ISBN13 9780890066522
Publishers Artech House Publishers
Pages 372
Dimensions 156 × 234 × 22 mm   ·   648 g

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