Investigation of Gate Current in Neutron Irradiated Alxga1-Xn / Gan Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence - Thomas E Gray - Books - Biblioscholar - 9781288308347 - November 16, 2012
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Thomas E Gray
Investigation of Gate Current in Neutron Irradiated Alxga1-Xn / Gan Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence

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128 pages, Illustrations, black and white

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 16, 2012
ISBN13 9781288308347
Publishers Biblioscholar
Pages 128
Dimensions 189 × 246 × 7 mm   ·   185 g

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