Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functio - Paula Maria Vilarinho - Books - Springer-Verlag New York Inc. - 9781402030178 - March 2, 2005
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Paula Maria Vilarinho
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functio 2005 edition

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Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.

488 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released March 2, 2005
ISBN13 9781402030178
Publishers Springer-Verlag New York Inc.
Pages 488
Dimensions 156 × 232 × 28 mm   ·   961 g
Language English  
Editor Kingon, Angus
Editor Rosenwaks, Yossi
Editor Vilarinho, Paula M.

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