Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices - NATO Science Series II - E Gusev - Books - Springer-Verlag New York Inc. - 9781402043666 - January 27, 2006
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E Gusev
Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices - NATO Science Series II 2006 edition

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Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-K Dielectric Nano-Electronic Semiconductor Devices, St. Petersburg, Russia, from 11 to 14 July 2005.

492 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released January 27, 2006
ISBN13 9781402043666
Publishers Springer-Verlag New York Inc.
Pages 492
Dimensions 155 × 235 × 25 mm   ·   703 g
Language English  
Editor Gusev, Evgeni

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