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Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs Pinhong Chen 2004 edition
Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs
Pinhong Chen
As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. This book describes methods for computing delay variation due to coupling. Most of these methods are computationally efficient enough to be employed in a static timing analysis tool for integrated digital circuits.
113 pages, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | June 7, 2004 |
| ISBN13 | 9781402080913 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 113 |
| Dimensions | 155 × 235 × 9 mm · 367 g |
| Language | English |