Microscopy of Semiconducting Materials 2007: Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK - Springer Proceedings in Physics - - Books - Springer-Verlag New York Inc. - 9781402086144 - September 18, 2008
In case cover and title do not match, the title is correct

Microscopy of Semiconducting Materials 2007: Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK - Springer Proceedings in Physics 2008 edition

Price
$ 236.49
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jun 25 - Jul 7

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes.

512 pages, Illustrations (some col.)

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 18, 2008
ISBN13 9781402086144
Publishers Springer-Verlag New York Inc.
Pages 498
Dimensions 155 × 235 × 25 mm   ·   975 g
Editor Cullis, A.G.
Editor Midgley, P.A.

Mere med samme udgiver