Telman Aliev
Digital Noise Monitoring of Defect Origin - Lecture Notes in Electrical Engineering Telman Aliev Softcover reprint of hardcover 1st ed. 2007 edition

Name: Digital Noise Monitoring of Defect Origin - Lecture Notes in Electrical Engineering
Price: 106.99 USD
Availability: OutOfStock
Author: Telman Aliev

Price

$ 106.99

excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jun 30 - Jul 6

Our customers say:

Top-vurdering på Google Reviews, baseret på tusinder af anmeldelser.

14-day return policy in accordance with European consumer protection law

Top ranking on Trustpilot

Add to your iMusic wish list

Also available as:

Hardcover Book

2007 edition

(2007) $ 122.99

Digital Noise Monitoring of Defect Origin - Lecture Notes in Electrical Engineering

Telman Aliev

Softcover reprint of hardcover 1st ed. 2007 edition

This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.

224 pages, biography

Media	Books Paperback Book (Book with soft cover and glued back)
Released	November 24, 2010
ISBN13	9781441944108
Publishers	Springer-Verlag New York Inc.
Pages	224
Dimensions	155 × 235 × 12 mm · 335 g
Language	English