From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing - Jitendra B. Khare - Books - Springer-Verlag New York Inc. - 9781461285953 - September 26, 2011
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Jitendra B. Khare
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1996 edition

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Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

150 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 26, 2011
ISBN13 9781461285953
Publishers Springer-Verlag New York Inc.
Pages 150
Dimensions 155 × 235 × 9 mm   ·   249 g
Language English  

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