Hierarchical Modeling for Vlsi  Circuit Testing - the Springer International Series in Engineering and Computer Science - Debashis Bhattacharya - Books - Springer-Verlag New York Inc. - 9781461288190 - September 26, 2011
In case cover and title do not match, the title is correct

Hierarchical Modeling for Vlsi Circuit Testing - the Springer International Series in Engineering and Computer Science Softcover Reprint of the Original 1st Ed. 1990 edition

Price
$ 106.49
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jun 30 - Jul 6
Add to your iMusic wish list

160 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 26, 2011
ISBN13 9781461288190
Publishers Springer-Verlag New York Inc.
Pages 160
Dimensions 155 × 235 × 10 mm   ·   254 g
Language English  

Mere med samme udgiver