High Resolution Focused Ion Beams: Fib and Its Applications: the Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology - Jon Orloff - Books - Springer-Verlag New York Inc. - 9781461352297 - September 20, 2012
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Jon Orloff
High Resolution Focused Ion Beams: Fib and Its Applications: the Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology Softcover Reprint of the Original 1st Ed. 2003 edition

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304 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 20, 2012
ISBN13 9781461352297
Publishers Springer-Verlag New York Inc.
Pages 304
Dimensions 156 × 234 × 17 mm   ·   449 g
Language English  

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