IDDQ Testing of VLSI Circuits - Ravi K Gulati - Books - Springer-Verlag New York Inc. - 9781461363774 - October 12, 2012
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Ravi K Gulati
IDDQ Testing of VLSI Circuits Softcover reprint of the original 1st ed. 1993 edition

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Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported.

128 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 12, 2012
ISBN13 9781461363774
Publishers Springer-Verlag New York Inc.
Pages 124
Dimensions 178 × 254 × 7 mm   ·   240 g
Language English  
Editor Gulati, Ravi K.
Editor Hawkins, Charles F.

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