Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science - Yusuf Leblebici - Books - Springer-Verlag New York Inc. - 9781461364290 - September 27, 2012
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Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science Softcover Reprint of the Original 1st Ed. 1993 edition

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229 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 27, 2012
ISBN13 9781461364290
Publishers Springer-Verlag New York Inc.
Pages 229
Dimensions 155 × 235 × 13 mm   ·   335 g
Language English  

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