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Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science Yusuf Leblebici Softcover Reprint of the Original 1st Ed. 1993 edition
Hot-carrier Reliability of Mos Vlsi Circuits - the Springer International Series in Engineering and Computer Science
Yusuf Leblebici
229 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | September 27, 2012 |
| ISBN13 | 9781461364290 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 229 |
| Dimensions | 155 × 235 × 13 mm · 335 g |
| Language | English |