Ion Beam Surface Layer Analysis: Volume 2 - Otto Meyer - Books - Springer-Verlag New York Inc. - 9781461588818 - January 30, 2012
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Otto Meyer
Ion Beam Surface Layer Analysis: Volume 2 Softcover reprint of the original 1st ed. 1976 edition

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The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no vel applications.

508 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released January 30, 2012
ISBN13 9781461588818
Publishers Springer-Verlag New York Inc.
Pages 491
Dimensions 178 × 254 × 26 mm   ·   879 g
Language English  
Editor Meyer, Otto

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