Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method - Pierre-Richard Dahoo - Books - ISTE Ltd and John Wiley & Sons Inc - 9781786306876 - April 6, 2021
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Pierre-Richard Dahoo
Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method

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288 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 6, 2021
ISBN13 9781786306876
Publishers ISTE Ltd and John Wiley & Sons Inc
Pages 288
Dimensions 150 × 220 × 20 mm   ·   562 g
Language English  

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