X-ray Scattering From Semiconductors (2nd Edition) - Fewster, Paul F (Panalytical Research, Uk) - Books - Imperial College Press - 9781860943607 - July 8, 2003
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Fewster, Paul F (Panalytical Research, Uk)
X-ray Scattering From Semiconductors (2nd Edition) 2 Revised edition

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A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.

316 pages, Illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 8, 2003
ISBN13 9781860943607
Publishers Imperial College Press
Pages 316
Dimensions 154 × 230 × 24 mm   ·   666 g
Language English  

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