Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques - Sebastian Huhn - Books - Springer Nature Switzerland AG - 9783030692117 - April 20, 2022
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Sebastian Huhn
Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques 2021 edition

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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

164 pages, 75 Tables, color; 25 Illustrations, color; 22 Illustrations, black and white; XXI, 164 p.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 20, 2022
ISBN13 9783030692117
Publishers Springer Nature Switzerland AG
Pages 164
Dimensions 150 × 220 × 10 mm   ·   296 g
Language German  

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