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Fundamentals of Electromigration-Aware Integrated Circuit Design Jens Lienig Second Edition 2025 edition
Fundamentals of Electromigration-Aware Integrated Circuit Design
Jens Lienig
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | February 26, 2025 |
| ISBN13 | 9783031800221 |
| Publishers | Springer International Publishing AG |
| Pages | 167 |
| Dimensions | 150 × 220 × 20 mm · 479 g |
| Language | German |
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