Metrology and Standardization for Nanotechnology: Protocols and Industrial Innovations - Applications of Nanotechnology - E Mansfield - Books - Wiley-VCH Verlag GmbH - 9783527340392 - February 8, 2017
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E Mansfield
Metrology and Standardization for Nanotechnology: Protocols and Industrial Innovations - Applications of Nanotechnology

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Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.

626 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 8, 2017
ISBN13 9783527340392
Publishers Wiley-VCH Verlag GmbH
Pages 626
Dimensions 178 × 251 × 35 mm   ·   1.43 kg
Editor Fujita, Daisuke (National Institute for Materials Science (NIMS), Tsukuba, Japan; University of Tokyo, Japan)
Editor Kaiser, Debra L. (National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA; Massachusetts Institute of Technology (MIT))
Editor Mansfield, Elisabeth (National Institute of Standards and Technology (NIST), Boulder, CO, USA; University of Arizona, Tucson, USA)
Editor Van de Voorde, Marcel (University of Technology, Delft, Netherland)

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