Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach - NanoScience and Technology - Marin Alexe - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540206620 - April 6, 2004
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Marin Alexe
Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach - NanoScience and Technology 2004 edition

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This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM).

282 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 6, 2004
ISBN13 9783540206620
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 282
Dimensions 155 × 235 × 18 mm   ·   544 g
Language German  
Editor Alexe, Marin
Editor Gruverman, Alexei

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