Applied Scanning Probe Methods III: Characterization - NanoScience and Technology - Bharat Bhushan - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540269090 - February 22, 2006
In case cover and title do not match, the title is correct

Applied Scanning Probe Methods III: Characterization - NanoScience and Technology 2006 edition

Price
$ 155.99
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jun 2 - 8
Add to your iMusic wish list

There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.


378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 22, 2006
ISBN13 9783540269090
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 378
Dimensions 166 × 243 × 21 mm   ·   716 g
Language German  
Editor Bhushan, Bharat
Editor Fuchs, Harald

More by Bharat Bhushan

Show all