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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology Bharat Bhushan 2006 edition
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology
Bharat Bhushan
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | February 22, 2006 |
| ISBN13 | 9783540269090 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 378 |
| Dimensions | 166 × 243 × 21 mm · 716 g |
| Language | German |
| Editor | Bhushan, Bharat |
| Editor | Fuchs, Harald |
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