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Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK - Springer Proceedings in Physics Tony Cullis 2005 edition
Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK - Springer Proceedings in Physics
Tony Cullis
The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.
540 pages, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | April 10, 2006 |
| ISBN13 | 9783540319146 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 540 |
| Dimensions | 155 × 235 × 30 mm · 948 g |
| Language | German |
| Editor | Cullis, A.G. |
| Editor | Hutchison, John L. |