Applied Scanning Probe Methods: Characterization - Nanoscience and Technology - Donna R. Kemp - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540373186 - October 18, 2006
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Donna R. Kemp
Applied Scanning Probe Methods: Characterization - Nanoscience and Technology 1st edition

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Presents 10 chapters on a variety of techniques and refinements of Scanning Probe Methods (SPM) applications.

338 pages, 7 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 18, 2006
ISBN13 9783540373186
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 338
Dimensions 155 × 235 × 19 mm   ·   648 g
Language English  
Editor Bhushan, Bharat
Editor Fuchs, Harald
Editor Kawata, Satoshi

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