Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science - Stefan Rein - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642064531 - October 19, 2010
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Stefan Rein
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science Softcover reprint of hardcover 1st ed. 2005 edition

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Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.

492 pages, 29 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 19, 2010
ISBN13 9783642064531
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 492
Dimensions 155 × 235 × 26 mm   ·   721 g
Language English  

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