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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences Ludwig Reimer Softcover reprint of the original 2nd ed. 1998 edition
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences
Ludwig Reimer
The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
529 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | December 1, 2010 |
| ISBN13 | 9783642083723 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 529 |
| Dimensions | 241 × 161 × 33 mm · 771 g |
| Language | English |
| Contributor | Peter W Hawkes |
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