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Optical Characterization of Epitaxial Semiconductor Layers G Nther Bauer Softcover reprint of the original 1st ed. 1996 edition
Optical Characterization of Epitaxial Semiconductor Layers
G Nther Bauer
The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade.
429 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | December 14, 2011 |
| ISBN13 | 9783642796807 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 429 |
| Dimensions | 155 × 235 × 23 mm · 625 g |
| Language | German |
| Editor | Bauer, Gunther |
| Editor | Richter, Wolfgang |
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