Optical Characterization of Epitaxial Semiconductor Layers - G Nther Bauer - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642796807 - December 14, 2011
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Optical Characterization of Epitaxial Semiconductor Layers Softcover reprint of the original 1st ed. 1996 edition

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The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade.


429 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 14, 2011
ISBN13 9783642796807
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 429
Dimensions 155 × 235 × 23 mm   ·   625 g
Language German  
Editor Bauer, Gunther
Editor Richter, Wolfgang

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