Point Defects in Semiconductors II: Experimental Aspects - Springer Series in Solid-State Sciences - J. Bourgoin - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642818349 - December 8, 2011
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J. Bourgoin
Point Defects in Semiconductors II: Experimental Aspects - Springer Series in Solid-State Sciences Softcover reprint of the original 1st ed. 1983 edition

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In introductory solid-state physics texts we are introduced to the concept of a perfect crystalline solid with every atom in its proper place.

295 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 8, 2011
ISBN13 9783642818349
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 295
Dimensions 155 × 235 × 17 mm   ·   449 g
Language English  

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