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Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science Andrei Benediktovich Softcover reprint of the original 1st ed. 2014 edition
Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science
Andrei Benediktovich
The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.
331 pages, 71 black & white illustrations, 37 colour illustrations, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | August 27, 2016 |
| ISBN13 | 9783662520543 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 318 |
| Dimensions | 155 × 235 × 18 mm · 467 g |
| Language | German |
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