X-Ray Absorption Spectroscopy of Semiconductors - Springer Series in Optical Sciences - - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783662522127 - August 23, 2016
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X-Ray Absorption Spectroscopy of Semiconductors - Springer Series in Optical Sciences Softcover reprint of the original 1st ed. 2015 edition

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Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

377 pages, 99 black & white illustrations, 86 colour illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released August 23, 2016
ISBN13 9783662522127
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 361
Dimensions 155 × 235 × 20 mm   ·   530 g
Language German  
Editor Ridgway, Mark C.
Editor Schnohr, Claudia S.

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