Test Infrastructure Design: for Digital, Mixed-signal and Hierarchical Socs - Krishnendu Chakrabarty - Books - LAP LAMBERT Academic Publishing - 9783843373593 - February 28, 2011
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Test Infrastructure Design: for Digital, Mixed-signal and Hierarchical Socs

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Current-generation SOCs contain a heterogeneous mix of embedded cores, which include not only flat (non-hierarchical) digital modules, but also analog and hierarchical modules. The increase in SOC complexity has also been accompanied by the development of more versatile automatic test equipment (ATE). This book presents methods for modular test of heterogeneous SOCs, whereby test cost is reduced by combining effective test infrastructure design with efficient utilization of ATE resources. Test infrastructure design refers to the design and optimization of test wrappers and test access mechanisms, as well as test scheduling for efficient resource utilization.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 28, 2011
ISBN13 9783843373593
Publishers LAP LAMBERT Academic Publishing
Pages 188
Dimensions 226 × 11 × 150 mm   ·   298 g
Language German  

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